The semiconductor test cell is inefficient because throughput at the work area is interrupted while the tester waits on each subsequent set of devices to be staged. This wait time is called “index time” and it is one of the most significant problems in high volume semiconductor test. When the test cell is indexing, the tester is not performing its intended function. This denies the system of its maximum throughput and translates to higher per unit cost of test and lower profit margins. Celerint has engineered solutions to eliminate this problem. We do this by multiplexing multiple device handlers to a single tester.