This paper introduces the concept of time-of-flight reflectance estimation, and demonstrate a new technique that allows a camera to rapidly acquire reflectance properties of objects from a single viewpoint, over relatively long distances and without encircling equipment. We demonstrate a laser and time-of-flight camera based combined hardware framework, that measures material properties by indirectly illuminating an object by a laser source, and observing its reflected light indirectly using a time-of-flight camera. This setup collectively acquires dense angular, but low spatial sampling, of reflectance properties, within a limited solid angle range - all from a single viewpoint. Our ultra-fast imaging system captures ``streak images" that can separate out different bounces of light based on path length. Entanglements arise in the streak images, mixing signals from multiple paths if they have the same total path length. We show how reflectances can be recovered by solving for a linear system of equations and assuming parametric material models; these lower dimensional models enable us to disentangle measurements. We show proof-of-concept results that this method recovers parametric reflectance models for homogeneous and discretized heterogeneous patches, both using simulation and experimental hardware. As compared to lengthy or highly calibrated BRDF acquisition techniques, we demonstrate a device that can rapidly capture meaningful reflectance information (on the order of a second, though theoretically in nanoseconds). We expect hardware advances to improve the portability and speed of this device.