Intelligent Measuring Transducers and Systems for Smart Factories. Structure, Standardization and Metrological Support
V. Syasko1, R. Taimanov2, K. Gogolinskiy3, K. Sapozhnikova2
1 Consanta LLC, St. Petersburg, Russia
2 D.I. Mendeleev All-Russian Institute for Metrology (VNIIM), St. Petersburg, Russia
3 Saint-Petersburg Mining University, St. Petersburg, Russia
The basic principle "Digital end-to-end engineering across the entire value chain of both the product and the associated manufacturing system" implies the need for a similar design of NDT systems for physical and hardware-software interfacing of measuring transducers with cyber-physical systems (CPS) and distributed control systems while ensuring the unity of the principles of construction, operation, transmission and processing of measuring information, excluding the possibility of stopping production lines for setting, testing and verifying the NDT tools built into the technological process.
The report discusses the basic principles of constructing measuring instruments for smart factories, consisting of an intelligent primary measuring transducer, software and hardware interfaced to the CPS, a standardized wireless communication channel, a virtual secondary measuring transducer built using cloud technologies, digital twins "measuring transducer - object of control ” included in the distributed control system.
Terms and definitions in the field of standardization and uniformity of measurements of intelligent adaptive measuring transducers, based on the principles of direct metrological and diagnostic self-control and information redundancy, providing:
- automatic correction of the error resulting from the influence of influencing quantities and / or aging of the components;
- metrological self-healing in the event of a single defect;
- self-study;
- remote verification.
The investigated principles of construction and standardization of intelligent measuring transducers, as well as multi-parameter spatially distributed systems NDT and CM built on their basis, will create the basis for a significant increase in the values of intertesting intervals or exclude this concept and will provide the required reliability of NDT and CM results in the conditions of existing and future smart factories. , subject to the development of principles for validation and verification of digital models, as well as a number of other tasks of metrological support.
